00999nam0 2200253 450 991028062680332120180727234204.020180727g19992000km y0itay50 baitaITEffetti e meccanismi d'azione dell'ormone della crescita sul trasporto transepiteliale di acqua ed elettroliti in enterociti umanitesi di specializzazione in PediatriaGiulio De MarcoRoberto Berni CananiNapoliUniversità degli studi di Napoli "Federico II"1999-200035 p.30 cmPediatriaEndocrinologia pediatricaDe Marco,Giulio751488Berni Canani,RobertoITUNINAREICATUNIMARCBK99102806268033211999-2000 De MarcoDMEPEDMEPEEffetti e meccanismi d'azione dell'ormone della crescita sul trasporto transepiteliale di acqua ed elettroliti in enterociti umani1510943UNINA02263nam 2200373 450 99627934240331620231206213739.01-5044-0580-310.1109/IEEESTD.2015.7358452(CKB)3710000000553804(NjHacI)993710000000553804(EXLCZ)99371000000055380420231206d2015 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierIEC 63003 Edition 1.0 2015-12 IEEE Std 1505.1 IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM) /Institute of Electrical and Electronics EngineersPiscataway, New Jersey :IEEE,2015.1 online resource (175 pages)This standard represents an extension to the IEEE 1505 receiver fixture interface (RFI) standard specification. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more specific set of performance requirements that employ a common scalable: (a) pin map configuration; (b) specific connector modules; (c) respective contacts; (d) recommended switching implementation; and (e) legacy automatic test equipment (ATE) transitional devices. This is intentionally done to standardize the footprint and assure mechanical and electrical interoperability between past and future automatic test systems (ATS).63003-2015 - IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505IEC 63003 Edition 1.0 2015-12 IEEE Std 1505.1Computer input-output equipmentComputer input-output equipment.004.7NjHacINjHaclDOCUMENT996279342403316IEC 63003 Edition 1.0 2015-12 IEEE Std 1505.13646208UNISA