01233nam 2200361 450 99627934190331620171018112146.00-7381-5722-8(CKB)2670000000414802(WaSeSS)IndRDA00079141(NjHacI)992670000000414802(EXLCZ)99267000000041480220171018d2007 || |engur|||||||||||txtrdacontentcrdamediacrrdacarrierStandard for extensions to standard test interface language (STIL) for semiconductor design environmentsNew York :IEEE,2007.1 online resource (93 pages)2-8318-9348-8 Computer hardware description languagesStandardsIntegrated circuitsTestingStandardsComputer hardware description languagesStandards.Integrated circuitsTestingStandards.621.392WaSeSSWaSeSSDOCUMENT996279341903316Standard for extensions to standard test interface language (STIL) for semiconductor design environments2581151UNISA