01953nam 2200361 450 99627934180331620231208083648.00-7381-8687-210.1109/IEEESTD.2013.6617654(CKB)3780000000092210(NjHacI)993780000000092210(EXLCZ)99378000000009221020231208d2013 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierIEC 62860-1 2013(E) IEEE Std. 1620.1-2006 : Test methods for the characterization of organic transistor-based ring oscillators /Institute of Electrical and Electronics EngineersPiscataway, New Jersey :IEEE,2013.1 online resource (26 pages)Recommended methods and standardized reporting practices for electricalcharacterization of printed and organic ring oscillators are covered. Due to the nature of printedand organic circuits, significant measurement errors can be introduced if the electricalcharacterization design-of-experiment is not properly addressed. This standard describes themost common sources of measurement error, particularly for high-impedance electricalmeasurements commonly required for printed and organic ring oscillators. This standard alsogives recommended practices in order to minimize and/or characterize the effect of measurementartifacts and other sources of error encountered while measuring printed and organic ringoscillators.IEC 62860-1:2013(E) IEEE Std. 1620.1-2006: IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillatorsIEC 62860-1Oscillators, ElectricOscillators, Electric.621.381533NjHacINjHaclDOCUMENT996279341803316IEC 62860-13646209UNISA