02231nam 2200397 450 99627828970331620231207090152.00-7381-8164-1(CKB)3780000000090154(NjHacI)993780000000090154(EXLCZ)99378000000009015420231207d2013 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierIEEE Std 1636.2-2010 (Full_Use) /Institute of Electrical and Electronics EngineersNew York :IEEE,2013.1 online resource (viii, 66 pages) illustrationsInteroperability between components of automatic test systems (ATS) is promoted and facilitated. The standard facilitates the capture of maintenance action information (MAI) associated with the removal, repair, and replacement of a particular system component (e.g., unit(s) under test) in order to maintain/support that particular operational system. The MAI schema becomes a class of information that can be used within the SIMICA family of standards. The exchange format utilizes the XML formats. Keywords: automated test system (ATS), eXtensible markup language (XML), IEEE 1636.2, maintenance action information (MAI), Software Interface for Maintenance Information Collection and Analysis (SIMICA), XML schema.1636.2-2010 - IEEE Standard for Software Interface for Maintenance Information Collection and Analysis IEEE Std 1636.2-2010 (Full_Use): IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Maintenance Action Information via the Extensible Markup Language (XML)IEEE Standard for Software Interface for Maintenance Information Collection and Analysis IEEE Std 1636.2-2010 Automatic test equipmentDigital electronicsAutomatic test equipment.Digital electronics.621.381548NjHacINjHaclDOCUMENT996278289703316IEEE Std 1636.2-2010 (Full_Use)2577557UNISA