01851nam 2200385 450 99627828880331620231020005527.0(CKB)1000000000035379(NjHacI)991000000000035379(EXLCZ)99100000000003537920231020d2005 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierIEEE trial-use standard for testability and diagnosability characteristics and metrics /IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems, Institute of Electrical and Electronics Engineers, IEEE-SA Standards BoardNew York, N.Y. :Institute of Electrical and Electronics Engineers,2005.1 online resource (v, 35 pages)0-7381-4493-2 This standard was developed to provide standard, unambiguous definitions of testability diagnosability metrics and characteristics. It builds on fundamental definitions derived from elements in formal information models related to test and diagnosis defined in IEEE Std 1232-2002.IEEE Std 1522-2004: IEEE Trial-Use Standard for Testability and Diagnosability Characteristics and MetricsArtificial intelligenceStandardsExpert systems (Computer science)StandardsArtificial intelligenceStandards.Expert systems (Computer science)Standards.006.3Institute of Electrical and Electronics Engineers,IEEE-SA Standards Board,NjHacINjHaclDOCUMENT996278288803316IEEE trial-use standard for testability and diagnosability characteristics and metrics3574601UNISA