01941nam 2200349 450 99627828720331620231207090155.00-7381-6066-0(CKB)3780000000090169(NjHacI)993780000000090169(EXLCZ)99378000000009016920231207d2009 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierIEEE Std 1671.1-2009 IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions /Institute of Electrical and Electronics EngineersNew York :IEEE,2009.1 online resource (viii, 185 pages) illustrationsThis document specifies an exchange format, using the eXtensible Markup Language (XML), for exchanging the test description information defining test performance, test conditions, diagnostic requirements, and support equipment to locate, align, and verify the proper operation of a unit under test (UUT). This is in support of the development of test program sets (TPSs) that will be used in an automatic test environment. Keywords: automatic test equipment (ATE), Automatic Test Markup Language (ATML), Automatic Test Markup Language (ATML) instance document, automatic test system (ATS), diagnostic requirements, test description, Test Program Set (TPS), test requirements, Test Requirements Document (TRD), XML schema.1671.1-2009 - IEEE Trial-Use Standard for Automatic Test Markup Language IEEE Std 1671.1-2009Automatic test equipmentAutomatic test equipment.621.381548NjHacINjHaclDOCUMENT996278287203316IEEE Std 1671.1-20093646652UNISA