01881oam 2200517zu 450 99621875110331620210807003225.0(CKB)111026746701400(SSID)ssj0000393965(PQKBManifestationID)12080969(PQKBTitleCode)TC0000393965(PQKBWorkID)10386467(PQKB)11703248(EXLCZ)9911102674670140020160829d2000 uy engtxtccr2000 IEEE International Workshop on Defect Based Testing : April 30, 2000, Montreal, Canada : proceedings[Place of publication not identified]IEEE Computer Society2000Bibliographic Level Mode of Issuance: Monograph0-7695-0637-2 Integrated circuitsDefectsCongressesIddq testingCongressesMetal oxide semiconductors, ComplementaryCongressesElectrical & Computer EngineeringHILCCElectrical EngineeringHILCCEngineering & Applied SciencesHILCCIntegrated circuitsDefectsIddq testingMetal oxide semiconductors, ComplementaryElectrical & Computer EngineeringElectrical EngineeringEngineering & Applied Sciences621.3815Menon Sankaran MSachdev ManojMalaiya Yashwant KIEEE Computer Society Test Technology Technical CommitteeIEEE International Workshop on Defect Based TestingPQKBPROCEEDING9962187511033162000 IEEE International Workshop on Defect Based Testing : April 30, 2000, Montreal, Canada : proceedings2353611UNISA