01917oam 2200505zu 450 99621874440331620210807003237.0(CKB)111026746701432(SSID)ssj0000395442(PQKBManifestationID)12118419(PQKBTitleCode)TC0000395442(PQKBWorkID)10450597(PQKB)11460745(EXLCZ)9911102674670143220160829d2000 uy engtxtccrRecords of the 2000 IEEE International Workshop on Memory Technology, Design and Testing : August 7-8, 2000, San Jose, California[Place of publication not identified]IEEE Computer Society2000Bibliographic Level Mode of Issuance: Monograph0-7695-0689-5 Semiconductor storage devicesTestingCongressesRandom access memoryCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCSemiconductor storage devicesTestingRandom access memoryElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.39/732Rajsuman RochitWik TIEEE Computer Society Technical Committee on VLSI,IEEE Computer Society Technical Council on Test Technology.IEEE Computer SocietyIEEE International Workshop on Memory Technology, Design and TestingPQKBPROCEEDING996218744403316Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing : August 7-8, 2000, San Jose, California2353609UNISA