01025nam--2200361---450-99000194114020331620080204153134.0000194114USA01000194114(ALEPH)000194114USA0100019411420040818d1944----km-y0itay50------baitaITy|||z|||001yyIbsenScipio SlataperFirenzeSansoni1944VI, 365 p.21 cmBiblioteca sansoniana critica72001Biblioteca sansoniana criticaIbsen,Henrik839.82SLATAPER,Scipio158726ITsalbcISBD990001941140203316XIII.1.B. 700(V E Coll. 154/7)14727 L.M.XIII.1.00054472BKUMASIAV21020040818USA011219COPAT59020060418USA011248ANNAMARIA9020080204USA011531Ibsen88820UNISA01131nam 2200361 450 99621858670331620180328085312.01-5386-0065-X(CKB)1000000000035911(WaSeSS)IndRDA00096701(EXLCZ)99100000000003591120180328d2005 || |engur|||||||||||txtrdacontentcrdamediacrrdacarrierDBT 2005 proceedings, 2005 IEEE International Workshop on Current and Defect Based Testing, 2005 : 1 May 2005New York :IEEE,2005.1 online resource (81 pages)1-4244-0034-1 Integrated circuitsDefectsCongressesIddq testingCongressesMetal oxide semiconductors, ComplementaryCongressesIntegrated circuitsDefectsIddq testingMetal oxide semiconductors, ComplementaryWaSeSSWaSeSSPROCEEDING996218586703316DBT 20052422816UNISA