02152oam 2200565zu 450 99621838420331620210806235740.01-5090-9447-4(CKB)1000000000278050(SSID)ssj0000394403(PQKBManifestationID)12138339(PQKBTitleCode)TC0000394403(PQKBWorkID)10387619(PQKB)11290847(EXLCZ)99100000000027805020160829d2006 uy engtxtccrThird IEEE International Workshop on Electronic Design, Test, and Applications : proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia[Place of publication not identified]IEEE Computer Society2006Bibliographic Level Mode of Issuance: Monograph0-7695-2500-8 Integrated circuitsTestingCongressesIntegrated circuitsDesign and constructionCongressesMicroelectronicsDesignCongressesMicroelectronicsTestingCongressesElectrical & Computer EngineeringHILCCElectrical EngineeringHILCCEngineering & Applied SciencesHILCCIntegrated circuitsTestingIntegrated circuitsDesign and constructionMicroelectronicsDesignMicroelectronicsTestingElectrical & Computer EngineeringElectrical EngineeringEngineering & Applied Sciences621.381Girard PatrickOsseiran AdamChew Moi-TinIEEE Computer Society Technical Council on Test Technology.IEEE Malaysia SectionIEEE International Workshop on Electronic Design, Test and ApplicationsPQKBPROCEEDING996218384203316Third IEEE International Workshop on Electronic Design, Test, and Applications : proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia2312742UNISA