01718oam 2200493zu 450 99621804690331620210807003541.0(CKB)111026746727330(SSID)ssj0000454734(PQKBManifestationID)12150189(PQKBTitleCode)TC0000454734(PQKBWorkID)10397860(PQKB)11704822(EXLCZ)9911102674672733020160829d1999 uy engtxtccrProceedings, International Test Conference 1999[Place of publication not identified]International Test Conference1999Bibliographic Level Mode of Issuance: Monograph0-7803-5753-1 Integrated circuitsTestingCongressesElectronic digital computersCircuitsTestingCongressesEmbedded computer systemsTestingCongressesMicroprocessorsTestingCongressesElectrical & Computer EngineeringHILCCElectrical EngineeringHILCCEngineering & Applied SciencesHILCCIntegrated circuitsTestingElectronic digital computersCircuitsTestingEmbedded computer systemsTestingMicroprocessorsTestingElectrical & Computer EngineeringElectrical EngineeringEngineering & Applied Sciences621.3815/48IEEE Computer SocietyPQKBPROCEEDING996218046903316Proceedings, International Test Conference 19992380645UNISA