02222oam 2200505zu 450 99621794190331620210807000316.0(CKB)1000000000021612(SSID)ssj0000395945(PQKBManifestationID)12103362(PQKBTitleCode)TC0000395945(PQKBWorkID)10473855(PQKB)11322518(EXLCZ)99100000000002161220160829d2003 uy engtxtccrFourth International Symposium on Quality Electronic Design : proceedings : 24-26 March, 2003, San Jose, California[Place of publication not identified]IEEE Computer Society2003Bibliographic Level Mode of Issuance: Monograph0-7695-1881-8 Integrated circuitsVery large scale integrationReliabilityCongressesIntegrated circuitsVery large scale integrationDesign and constructionCongressesIntegrated circuitsComputer-aided designVery large scale integrationCongressesIntegrated circuitsVery large scale integrationQuality controlTestingCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCIntegrated circuitsVery large scale integrationReliabilityIntegrated circuitsVery large scale integrationDesign and constructionIntegrated circuitsComputer-aided designVery large scale integrationIntegrated circuitsVery large scale integrationQuality controlTestingElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.39/5IEEE Electron Devices SocietyInternational Symposium on Quality Electronic DesignPQKBPROCEEDING996217941903316Fourth International Symposium on Quality Electronic Design : proceedings : 24-26 March, 2003, San Jose, California2385911UNISA