01950oam 2200517zu 450 99621769830331620210807003406.0(CKB)111055184252444(SSID)ssj0000396663(PQKBManifestationID)12120026(PQKBTitleCode)TC0000396663(PQKBWorkID)10334596(PQKB)10188976(EXLCZ)9911105518425244420160829d2001 uy engtxtccrITC : International Test Conference 2001 : proceedings : October 30-November 1, 2001, Baltimore, MD, USA[Place of publication not identified]International Test Conference2001Bibliographic Level Mode of Issuance: Monograph0-7803-7169-0 Integrated circuitsTestingCongressesElectronic digital computersCircuitsTestingCongressesTelecommunicationCongressesRadio frequencyCongressesElectrical EngineeringHILCCElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCIntegrated circuitsTestingElectronic digital computersCircuitsTestingTelecommunicationRadio frequencyElectrical EngineeringElectrical & Computer EngineeringEngineering & Applied Sciences621.3815/48Institute of Electrical and Electronics Engineers Philadelphia Section.IEEE Computer Society Test Technology Technical CommitteeInternational Test ConferencePQKBPROCEEDING996217698303316ITC : International Test Conference 2001 : proceedings : October 30-November 1, 2001, Baltimore, MD, USA2534764UNISA