01877oam 2200517zu 450 99621725300331620210807000353.00-7695-1233-X(CKB)1000000000022877(SSID)ssj0000995902(PQKBManifestationID)12458308(PQKBTitleCode)TC0000995902(PQKBWorkID)10973389(PQKB)10314319(EXLCZ)99100000000002287720160829d2001 uy engtxtccr10th anniversary compendium of papers from Asian Test Symposium : proceedings : 1992-2001[Place of publication not identified]IEEE Computer Society2001Bibliographic Level Mode of Issuance: MonographATS 2001 compendiumatsElectronic digital computersTestingCircuitsCongressesElectronic circuitsTestingCongressesFault-tolerant computingCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCElectronic digital computersTestingCircuitsElectronic circuitsTestingFault-tolerant computingElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.3815/48IEEE Computer Society Test Technology Technical CommitteeAsian Test Symposium Tenth Anniversary Committee.Asian Test Symposium.PQKBPROCEEDING99621725300331610th anniversary compendium of papers from Asian Test Symposium : proceedings : 1992-20012361712UNISA