01284oam 2200397zu 450 99621717190331620210807001457.01-4244-5598-7(CKB)2670000000033746(SSID)ssj0000452241(PQKBManifestationID)12157752(PQKBTitleCode)TC0000452241(PQKBWorkID)10463614(PQKB)11471003(NjHacI)992670000000033746(EXLCZ)99267000000003374620160829d2010 uy engur|||||||||||txtccr2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits[Place of publication not identified]I E E E20101 online resourceBibliographic Level Mode of Issuance: Monograph1-4244-5596-0 Integrated circuitsTestingCongressesIntegrated circuitsTesting621.381548IEEE StaffPQKBPROCEEDING9962171719033162010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits2531676UNISA