00989nam 2200313 450 99621663150331620180319133757.01-5090-8176-3(CKB)1000000000711324(WaSeSS)IndRDA00095549(EXLCZ)99100000000071132420180319d2008 || |engur|||||||||||txtrdacontentcrdamediacrrdacarrierVTS 2008 proceedings : 26th IEEE VLSI Test Symposium : San Diego, California, 27 April - 1 May 2008New York :IEEE,2008.1 online resource (xxx, 413 pages)0-7695-3123-7 Integrated circuitsVery large scale integrationTestingCongressesIntegrated circuitsVery large scale integrationTestingWaSeSSWaSeSSPROCEEDING996216631503316VTS 20082352219UNISA