01823nam 2200421 450 99621650540331620180302150416.01-5090-8441-X(CKB)1000000000711226(WaSeSS)IndRDA00093276(EXLCZ)99100000000071122620180302d2008 || |engur|||||||||||txtrdacontentcrdamediacrrdacarrierThe 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems proceedings : Boston, Massachusetts, 1-3 October 2008 /edited by Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, and Mohammad Tehranipoor ; sponsored by The IEEE Computer Society Test Technology Technical Council, The IEEE Computer Society Technical Committee on Fault Tolerant ComputingNew York :IEEE,2008.1 online resource (xxxi, 545 pages)Includes index.0-7695-3365-5 Integrated circuitsVery large scale integrationDesign and constructionCongressesFault-tolerant computingCongressesIntegrated circuitsVery large scale integrationDesign and constructionFault-tolerant computingBolchini CristianaKim Yong-BinGizopoulos DimitrisTehranipoor Mohammad H.1974-IEEE Computer Society.Technical Council on Test Technology,IEEE Computer Society.Fault-Tolerant Computing Technical Committee,WaSeSSWaSeSSPROCEEDING996216505403316The 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems2352228UNISA