00907oam 2200325zu 450 99621650120331620210807000607.01-4244-6650-4(CKB)2560000000009703(SSID)ssj0000452711(PQKBManifestationID)12169545(PQKBTitleCode)TC0000452711(PQKBWorkID)10472046(PQKB)11633746(EXLCZ)99256000000000970320160829d2010 uy engtxtccr2010 28th VLSI Test Symposium[Place of publication not identified]IEEE2010Bibliographic Level Mode of Issuance: Monograph1-4244-6649-0 IEEE StaffPQKBPROCEEDING9962165012033162010 28th VLSI Test Symposium2512205UNISA