01824oam 2200469zu 450 99621508000331620210807003547.0(CKB)111026746726250(SSID)ssj0000395389(PQKBManifestationID)12129192(PQKBTitleCode)TC0000395389(PQKBWorkID)10450654(PQKB)10132866(EXLCZ)9911102674672625020160829d1999 uy engtxtccr1999 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1998[Place of publication not identified]IEEE Electron Devices Society1999Bibliographic Level Mode of Issuance: Monograph0-7803-5649-7 Integrated circuitsReliabilityCongressesIntegrated circuitsReliabilityWafer-scale integrationCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCIntegrated circuitsReliabilityIntegrated circuitsReliabilityWafer-scale integrationElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.3815IEEE Reliability SocietyIEEE Electron Devices SocietyInternational Integrated Reliability WorkshopPQKBPROCEEDING9962150800033161999 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 19982540781UNISA