02191oam 2200493zu 450 99621493830331620210807000301.0(CKB)1000000000021777(SSID)ssj0000395946(PQKBManifestationID)12171349(PQKBTitleCode)TC0000395946(PQKBWorkID)10456974(PQKB)10991005(EXLCZ)99100000000002177720160829d2004 uy engtxtccr5th International Symposium on Quality Electronic Design : proceedings : 22-24 March, 2004, San Jose, California[Place of publication not identified]IEEE Computer Society2004Bibliographic Level Mode of Issuance: Monograph0-7695-2093-6 Integrated circuitsVery large scale integrationReliabilityCongressesIntegrated circuitsVery large scale integrationDesign and constructionCongressesIntegrated circuitsComputer-aided designVery large scale integrationCongressesIntegrated circuitsQuality controlVery large scale integrationTestingCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCIntegrated circuitsVery large scale integrationReliabilityIntegrated circuitsVery large scale integrationDesign and constructionIntegrated circuitsComputer-aided designVery large scale integrationIntegrated circuitsQuality controlVery large scale integrationTestingElectrical & Computer EngineeringEngineering & Applied SciencesElectrical EngineeringIEEE Electron Devices SocietyInternational Symposium on Quality Electronic DesignPQKBPROCEEDING9962149383033165th International Symposium on Quality Electronic Design : proceedings : 22-24 March, 2004, San Jose, California2418279UNISA