01956oam 2200469zu 450 99621478960331620210807000258.0(CKB)1000000000021737(SSID)ssj0000393962(PQKBManifestationID)12108585(PQKBTitleCode)TC0000393962(PQKBWorkID)10386407(PQKB)10832955(EXLCZ)99100000000002173720160829d2003 uy engtxtccr18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 3-5 November, 2003, Boston, Massachusetts[Place of publication not identified]IEEE Computer Society Press2003Bibliographic Level Mode of Issuance: Monograph0-7695-2042-1 Integrated circuitsDesign and constructionVery large scale integrationCongressesFault-tolerant computingCongressesElectrical & Computer EngineeringHILCCElectrical EngineeringHILCCEngineering & Applied SciencesHILCCIntegrated circuitsDesign and constructionVery large scale integrationFault-tolerant computingElectrical & Computer EngineeringElectrical EngineeringEngineering & Applied SciencesBolchini CristianaIEEE Computer Society Fault-Tolerant Computing Technical Committee.IEEE Computer Society Test Technology Technical CommitteeIEEE International Symposium on Defect and Fault Tolerance in VLSI SystemsPQKBPROCEEDING99621478960331618th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 3-5 November, 2003, Boston, Massachusetts2378645UNISA