01834oam 2200469zu 450 99621435170331620210807003448.0(CKB)111026746709370(SSID)ssj0000445298(PQKBManifestationID)12128033(PQKBTitleCode)TC0000445298(PQKBWorkID)10485018(PQKB)11665881(EXLCZ)9911102674670937020160829d1994 uy engtxtccr1994 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 16-19, 1994[Place of publication not identified]IEEE Electron Devices Society1994Bibliographic Level Mode of Issuance: Monograph0-7803-1908-7 Integrated circuitsReliabilityCongressesIntegrated circuitsReliabilityCongressesWafer scale integrationElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCIntegrated circuitsReliabilityCongressesIntegrated circuitsReliabilityCongressesWafer scale integrationElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.3815/2IEEE Reliability SocietyIEEE Electron Devices SocietyInternational Integrated Reliability WorkshopPQKBBOOK9962143517033161994 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 16-19, 19942524679UNISA