01641oam 2200457zu 450 99621434690331620210807003446.0(CKB)111026746710498(SSID)ssj0000450944(PQKBManifestationID)12168891(PQKBTitleCode)TC0000450944(PQKBWorkID)10459515(PQKB)11411937(EXLCZ)9911102674671049820160829d1994 uy engtxtccrProceedings - International Test Conference (25th : 1994 : Washington D.C)[Place of publication not identified]The Conference1994Bibliographic Level Mode of Issuance: Monograph0-7803-2103-0 Integrated circuitsTestingCongressesElectronic digital computersTestingCongressesCircuitsElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCIntegrated circuitsTestingCongressesElectronic digital computersTestingCongressesCircuitsElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.3815/48Institute of Electrical and Electronics EngineersInternational Test ConferencePQKBBOOK996214346903316Proceedings - International Test Conference (25th : 1994 : Washington D.C)2508023UNISA