01443oam 2200445zu 450 99621396970331620210807003129.01-5090-7784-7(CKB)1000000000710006(SSID)ssj0000453227(PQKBManifestationID)12149014(PQKBTitleCode)TC0000453227(PQKBWorkID)10472543(PQKB)11272082(WaSeSS)IndRDA00093488(EXLCZ)99100000000071000620160829d2008 uy engur|||||||||||txtccr2008 IEEE International Workshop on Microprocessor Test and Verification[Place of publication not identified]IEEE20081 online resource (110 pages)Bibliographic Level Mode of Issuance: Monograph0-7695-3581-X 1-4244-3682-6 MicroprocessorsTestingCongressesSystems on a chipTestingCongressesIntegrated circuitsVerificationCongressesMicroprocessorsTestingSystems on a chipTestingIntegrated circuitsVerificationIEEE StaffPQKBPROCEEDING9962139697033162008 IEEE International Workshop on Microprocessor Test and Verification2385870UNISA