01996oam 2200529zu 450 99621259760331620210807003349.0(CKB)111026746721694(SSID)ssj0000455090(PQKBManifestationID)12149058(PQKBTitleCode)TC0000455090(PQKBWorkID)10398954(PQKB)11087862(EXLCZ)9911102674672169420160829d1998 uy engtxtccr1998 IEEE Autotestcon proceedings : [Autotestcon '98] : IEEE Systems Readiness Technology Conference : Test technology for the 21st Century : [24-27 August, 1998, Salt Lake City, Utah][Place of publication not identified]IEEE1998Bibliographic Level Mode of Issuance: Monograph0-7803-4420-0 Systems engineeringTestingCongressesAutomatic test equipmentTestingCongressesAvionicsTestingCongressesMilitary suppliesCongressesMotor vehiclesCongressesMechanical EngineeringHILCCMechanical Engineering - GeneralHILCCEngineering & Applied SciencesHILCCSystems engineeringTestingAutomatic test equipmentTestingAvionicsTestingMilitary suppliesMotor vehiclesMechanical EngineeringMechanical Engineering - GeneralEngineering & Applied Sciences670.42/5Institute of Electrical and Electronics EngineersAutotestconPQKBPROCEEDING9962125976033161998 IEEE Autotestcon proceedings : : IEEE Systems Readiness Technology Conference : Test technology for the 21st Century : 24-27 August, 1998, Salt Lake City, Utah2544586UNISA