01824oam 2200469zu 450 99621258990331620210807003351.0(CKB)111026746722826(SSID)ssj0000395388(PQKBManifestationID)12126989(PQKBTitleCode)TC0000395388(PQKBWorkID)10455789(PQKB)11683787(EXLCZ)9911102674672282620160829d1998 uy engtxtccr1998 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998[Place of publication not identified]IEEE Electron Devices Society1998Bibliographic Level Mode of Issuance: Monograph0-7803-4881-8 Integrated circuitsReliabilityCongressesIntegrated circuitsReliabilityWafer-scale integrationCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCIntegrated circuitsReliabilityIntegrated circuitsReliabilityWafer-scale integrationElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.3815IEEE Reliability SocietyIEEE Electron Devices SocietyInternational Integrated Reliability WorkshopPQKBPROCEEDING9962125899033161998 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 19982495472UNISA