01714oam 2200505zu 450 99621247440331620210807003358.00-7803-4210-0(CKB)111026746720558(SSID)ssj0000455199(PQKBManifestationID)12150313(PQKBTitleCode)TC0000455199(PQKBWorkID)10399569(PQKB)10788202(EXLCZ)9911102674672055820160829d1997 uy engtxtccrProceedings[Place of publication not identified]The Conference1997Bibliographic Level Mode of Issuance: MonographInternational Test Conference 1997 itcPROCEEDINGSIntegrated circuitsCongressesTestingElectronic digital computersTestingCongressesCircuitsElectrical & Computer EngineeringHILCCElectrical EngineeringHILCCEngineering & Applied SciencesHILCCIntegrated circuitsCongressesTestingElectronic digital computersTestingCongressesCircuitsElectrical & Computer EngineeringElectrical EngineeringEngineering & Applied Sciences621.3815/48IEEE Computer Society Test Technology Technical CommitteeInstitute of Electrical and Electronics Engineers Philadelphia Section.International Test ConferencePQKBPROCEEDING996212474403316Proceedings57126UNISA