01084nam 2200337 450 99621238830331620180306152414.01-5090-6813-9(CKB)2400000000003076(WaSeSS)IndRDA00093624(EXLCZ)99240000000000307620180306d2009 || |engur|||||||||||txtrdacontentcrdamediacrrdacarrier2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis 28-29 April 2009New York :IEEE,2009.1 online resource (430 pages)1-4244-2587-5 Computer programsTestingCongressesAutomatic test equipmentCongressesComputer programsTestingAutomatic test equipmentWaSeSSWaSeSSPROCEEDING9962123883033162009 IEEE Circuits and Systems International Conference on Testing and Diagnosis2524343UNISA