01521oam 2200457zu 450 99621137820331620210807003610.0(CKB)111026746748730(SSID)ssj0000450947(PQKBManifestationID)12140512(PQKBTitleCode)TC0000450947(PQKBWorkID)10445159(PQKB)11364291(EXLCZ)9911102674674873020160829d1991 uy engtxtccrInternational Test Conference, 1991 : proceedings[Place of publication not identified]The Conference1991Bibliographic Level Mode of Issuance: Monograph0-8186-9156-5 Integrated circuitsTestingCongressesAutomatic test equipmentCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCIntegrated circuitsTestingAutomatic test equipmentElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.3815/48Institute of Electrical and Electronics EngineersInternational Test ConferencePQKBBOOK996211378203316International Test Conference, 1991 : proceedings2495144UNISA