01785oam 2200481zu 450 99621137660331620210807003607.0(CKB)111026746748744(SSID)ssj0000395154(PQKBManifestationID)12107939(PQKBTitleCode)TC0000395154(PQKBWorkID)10426144(PQKB)11414605(EXLCZ)9911102674674874420160829d1998 uy engtxtccr1998 IEEE International Workshop on IDDQ Testing : proceedings : November 12-13, 1998, San Jose, California[Place of publication not identified]IEEE Computer Society Press1998Bibliographic Level Mode of Issuance: Monograph0-8186-9191-3 Iddq testingCongressesMetal oxide semiconductors, ComplementaryTestingCongressesElectrical & Computer EngineeringHILCCElectrical EngineeringHILCCEngineering & Applied SciencesHILCCIddq testingCongressesMetal oxide semiconductors, ComplementaryTestingElectrical & Computer EngineeringElectrical EngineeringEngineering & Applied Sciences621.39/5/0287Malaiya Yashwant KMenon Sankaran MIEEE Computer Society Technical Test Technology Committee.IEEE International Workshop on IDDQ TestingPQKBPROCEEDING9962113766033161998 IEEE International Workshop on IDDQ Testing : proceedings : November 12-13, 1998, San Jose, California2389606UNISA