01834oam 2200517zu 450 99621125880331620210807003423.0(CKB)111055184256788(SSID)ssj0000527249(PQKBManifestationID)12175703(PQKBTitleCode)TC0000527249(PQKBWorkID)10524982(PQKB)11652419(EXLCZ)9911105518425678820160829d2002 uy engtxtccrProceedings International Test Conference 2002[Place of publication not identified]International Test Conference2002Bibliographic Level Mode of Issuance: Monograph0-7803-7542-4 Integrated circuitsTestingCongressesElectronic digital computersTestingCircuitsCongressesTelecommunicationCongressesRadio frequencyCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCIntegrated circuitsTestingElectronic digital computersTestingCircuitsTelecommunicationRadio frequencyElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.3815/48IEEE Computer Society Test Technology Technical CommitteeInstitute of Electrical and Electronics Engineers Philadelphia Section.International Test ConferencePQKBPROCEEDING996211258803316Proceedings International Test Conference 20022506427UNISA