01168nam 2200337 450 99621125400331620180228150422.0(CKB)111055184257866(WaSeSS)IndRDA00092904(EXLCZ)9911105518425786620180228d2002 || |engur|||||||||||txtrdacontentcrdamediacrrdacarrier2001 GaAs Reliability Workshop proceedings : October 21, 2001, Baltimore, Maryland /sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality StandardsNew York :IEEE,2002.1 online resource (222 pages)0-7908-0066-7 Gallium arsenide semiconductorsCongressesSemiconductorsReliabilityCongressesGallium arsenide semiconductorsSemiconductorsReliabilityJEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards,WaSeSSWaSeSSPROCEEDING9962112540033162001 GaAs Reliability Workshop2509187UNISA