01853oam 2200469zu 450 99621074500331620210807000329.0(CKB)1000000000021674(SSID)ssj0000395822(PQKBManifestationID)12145836(PQKBTitleCode)TC0000395822(PQKBWorkID)10460257(PQKB)10485621(EXLCZ)99100000000002167420160829d2003 uy engtxtccrProceedings, 9th IEEE International On-Line Testing Symposium : IOLTS 2003, 7-9 July 2003, Kos International Convention Center, Kos Island, Greece[Place of publication not identified]IEEE Computer Society2003Bibliographic Level Mode of Issuance: Monograph0-7695-1968-7 Electronic circuitsTestingData processingCongressesError-correcting codes (Information theory)CongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCElectronic circuitsTestingData processingError-correcting codes (Information theory)Electrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.3815/48Metra CIEEE Computer Society Technical Council on Test Technology.IEEE International On-Line Testing SymposiumPQKBPROCEEDING996210745003316Proceedings, 9th IEEE International On-Line Testing Symposium : IOLTS 2003, 7-9 July 2003, Kos International Convention Center, Kos Island, Greece2389413UNISA