01907oam 2200493zu 450 99621026330331620210807003556.0(CKB)111026746740838(SSID)ssj0000442249(PQKBManifestationID)12154657(PQKBTitleCode)TC0000442249(PQKBWorkID)10462639(PQKB)11198942(EXLCZ)9911102674674083820160829d1995 uy engtxtccrRecords of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California[Place of publication not identified]IEEE Computer Society Press1995Bibliographic Level Mode of Issuance: Monograph0-8186-7102-5 Semiconductor storage devicesTestingCongressesRandom access memoryCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCSemiconductor storage devicesTestingCongressesRandom access memoryCongressesElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.39/732Rajsuman RochitRajkanan KIEEE Computer Society Test Technology Technical CommitteeIEEE Computer Society Technical Committee on VLSI,IEEE International Workshop on Memory Technology, Design, and TestingPQKBBOOK996210263303316Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California2424485UNISA