01748oam 2200445zu 450 99621004400331620210807003341.0(CKB)111085500350182(SSID)ssj0000396306(PQKBManifestationID)12111769(PQKBTitleCode)TC0000396306(PQKBWorkID)10464701(PQKB)11377535(EXLCZ)9911108550035018220160829d2003 uy engtxtccrNineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : SEMI-THERM proceedings 2003 : San Jose, CA, USA, March 11-13, 2003[Place of publication not identified]IEEE2003Bibliographic Level Mode of Issuance: Monograph0-7803-7793-1 SemiconductorsThermal propertiesCongressesSemiconductorsCoolingCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCSemiconductorsThermal propertiesSemiconductorsCoolingElectrical & Computer EngineeringEngineering & Applied SciencesElectrical EngineeringIEEE Components, Hybrids, and Manufacturing Technology SocietyIEEE Semiconductor Thermal Measurement and Management SymposiumPQKBPROCEEDING996210044003316Nineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : SEMI-THERM proceedings 2003 : San Jose, CA, USA, March 11-13, 20032524910UNISA