01844oam 2200469zu 450 99620919220331620210807003234.0(CKB)111026746708222(SSID)ssj0000450945(PQKBManifestationID)12147204(PQKBTitleCode)TC0000450945(PQKBWorkID)10459516(PQKB)11517736(EXLCZ)9911102674670822220160829d1993 uy engtxtccrDesigning, testing, and diagnostics--join them : International Test Conference 1993 proceedings :October 17-21, 1993, Convention Center, Baltimore, Maryland, USA[Place of publication not identified]The Conference1993Bibliographic Level Mode of Issuance: Monograph0-7803-1430-1 Integrated circuitsTestingCongressesAutomatic test equipmentCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCIntegrated circuitsTestingAutomatic test equipmentElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.3815/028/7IEEE Computer Society Test Technology Technical CommitteeInstitute of Electrical and Electronics Engineers Philadelphia Section.International Test ConferencePQKBBOOK996209192203316Designing, testing, and diagnostics--join them : International Test Conference 1993 proceedings :October 17-21, 1993, Convention Center, Baltimore, Maryland, USA2546901UNISA