02109nas 2200685-a 450 99620803530331620240413012149.0(CKB)954921418493(CONSER)---90660232-(EXLCZ)9995492141849319900227b19901996 --- aengtxtrdacontentcrdamediacrrdacarrierCD-ROM professionalWeston, CT Pemberton Press©1990-©19961 online resourceTitle from cover."The magazine of optical information media."Place of publication varies: <1993>-1996, Wilton, CT.Published: Wilton, CT : Online Inc., -1996.Refereed/Peer-reviewedPrint version: CD-ROM professional. 1049-0833 (DLC) 90660232 (OCoLC)21127593 CD-ROMsPeriodicalsCD-ROM publishingPeriodicalsCD-ROM publishingfast(OCoLC)fst00843361CD-ROMsfast(OCoLC)fst00843362Cd-romsgttMultimediagttOPTICAL DISCSunbistINFORMATION SYSTEMSunbistCD-ROMunbistELECTRONIC MAILunbistCD-ROMOrdinateursMémoires optiquesPériodiquesCédéromsPériodiquesÉdition sur cédéromPériodiquesPeriodicals.fastPeriodical.CD-ROMsCD-ROM publishingCD-ROM publishing.CD-ROMs.Cd-roms.Multimedia.OPTICAL DISCS.INFORMATION SYSTEMS.CD-ROM.ELECTRONIC MAIL.CD-ROM.OrdinateursMémoires optiquesCédéromsÉdition sur cédérom004.5/6JOURNAL996208035303316exl_impl conversionCD-ROM professional2052355UNISA01766oam 2200517zu 450 991014682970332120241212215319.097815090976781509097678(CKB)1000000000022601(SSID)ssj0000396666(PQKBManifestationID)12120027(PQKBTitleCode)TC0000396666(PQKBWorkID)10334531(PQKB)11539136(EXLCZ)99100000000002260120160829d2005 uy engtxtccr2005 IEEE International Test Conference (ITC) : 8-10 November, 2005, Austin, TX[Place of publication not identified]Institute of Electrical and Electronics Engineers2005Bibliographic Level Mode of Issuance: Monograph9780780390386 0780390385 Integrated circuitsTestingCongressesSemiconductorsTestingCongressesElectronicsCongressesElectrical EngineeringHILCCElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCIntegrated circuitsTestingSemiconductorsTestingElectronicsElectrical EngineeringElectrical & Computer EngineeringEngineering & Applied Sciences621.3815/48Institute of Electrical and Electronics Engineers,International Test Conference.PQKBPROCEEDING99101468297033212005 IEEE International Test Conference (ITC) : 8-10 November, 2005, Austin, TX2382075UNINA