02027oam 2200505zu 450 99620748480331620210806235816.01-5090-9548-9(CKB)1000000000278241(SSID)ssj0000394148(PQKBManifestationID)12102347(PQKBTitleCode)TC0000394148(PQKBWorkID)10386669(PQKB)10519948(EXLCZ)99100000000027824120160829d2006 uy engtxtccr2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology : IEEE DTIS 2006 : September 05-07, 2006, Tunis, Tunisia : proceedings[Place of publication not identified]Institute of Electrical and Electronics Engineers2006Bibliographic Level Mode of Issuance: Monograph0-7803-9726-6 Integrated circuitsDesign and constructionCongressesIntegrated circuitsTestingCongressesNanotechnologyDesignCongressesMicroelectronicsCongressesElectrical & Computer EngineeringHILCCElectrical EngineeringHILCCEngineering & Applied SciencesHILCCIntegrated circuitsDesign and constructionIntegrated circuitsTestingNanotechnologyDesignMicroelectronicsElectrical & Computer EngineeringElectrical EngineeringEngineering & Applied SciencesGirard PatrickInternational Conference on Design & Test of Integrated Systems in Nanoscale TechnologyPQKBPROCEEDING9962074848033162006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology : IEEE DTIS 2006 : September 05-07, 2006, Tunis, Tunisia : proceedings2506700UNISA