01296oam 2200397zu 450 99620697470331620210807001447.01-4577-0158-8(CKB)2670000000114736(SSID)ssj0000669493(PQKBManifestationID)12198770(PQKBTitleCode)TC0000669493(PQKBWorkID)10708910(PQKB)10794749(NjHacI)992670000000114736(EXLCZ)99267000000011473620160829d2011 uy engur|||||||||||txtccr2011 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits[Place of publication not identified]IEEE20111 online resource (407 pages) illustrationsBibliographic Level Mode of Issuance: Monograph1-4577-0159-6 Integrated circuitsTestingCongressesIntegrated circuitsTesting621.381548IEEE StaffPQKBPROCEEDING9962069747033162011 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits2538013UNISA