01184nam 2200373 450 99620659730331620180306125620.01-5090-7541-0(CKB)2400000000002488(WaSeSS)IndRDA00093562(EXLCZ)99240000000000248820180306d2009 || |engur|||||||||||txtrdacontentcrdamediacrrdacarrierATS 2009 proceedings : 2009 Asian Test Symposium : 23-26 November 2009, Taichung, TaiwanNew York :IEEE,2009.1 online resource (xxv, 465 pages)Includes index.0-7695-3864-9 Electronic circuitsTestingCongressesElectronic digital computersCircuitsTestingCongressesFault-tolerant computingCongressesElectronic circuitsTestingElectronic digital computersCircuitsTestingFault-tolerant computingWaSeSSWaSeSSPROCEEDING996206597303316ATS 20092307213UNISA