01717oam 2200481zu 450 99620626080331620210807000242.0(CKB)1000000000022781(SSID)ssj0000394954(PQKBManifestationID)12138236(PQKBTitleCode)TC0000394954(PQKBWorkID)10450786(PQKB)11642030(EXLCZ)99100000000002278120160829d2003 uy engtxtccr2003 GaAs Reliability Workshop : proceedings : November 9, 2003, San Diego, California[Place of publication not identified]JEDEC2003Bibliographic Level Mode of Issuance: Monograph0-7908-0104-3 Gallium arsenide semiconductorsReliabilityCongressesSemiconductorsMaterialsCongressesSemiconductorsCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCGallium arsenide semiconductorsReliabilitySemiconductorsMaterialsSemiconductorsElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.3815/2IEEE Electron Devices SocietyJEDEC JC-14.7 Committee on GaAs Reliability and Quality StandardsPQKBPROCEEDING9962062608033162003 GaAs Reliability Workshop : proceedings : November 9, 2003, San Diego, California2494782UNISA