01746oam 2200469zu 450 99620616150331620210807003532.0(CKB)111026746737452(SSID)ssj0000442271(PQKBManifestationID)12174680(PQKBTitleCode)TC0000442271(PQKBWorkID)10445451(PQKB)11284039(EXLCZ)9911102674673745220160829d1993 uy engtxtccrRecords of the 1993 IEEE International Workshop on Memory Testing, August 9-10, 1993, San Jose, California[Place of publication not identified]IEEE Computer Society Press1993Bibliographic Level Mode of Issuance: Monograph0-8186-4150-9 Semiconductor storage devicesTestingCongressesRandom access memoryCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCSemiconductor storage devicesTestingCongressesRandom access memoryCongressesElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.39/732/0287Rajsuman RochitIEEE Computer Society Test Technology Technical CommitteeIEEE International Workshop on Memory TestingPQKBBOOK996206161503316Records of the 1993 IEEE International Workshop on Memory Testing, August 9-10, 1993, San Jose, California2512192UNISA