01058nam0 22002651i 450 SUN004175420060420120000.004-7118-172-220060308d1999 |0engc50 baengUS|||| |||||Spectroscopic ellipsometry and reflectometrya user's guideHarland G. Tompkins, William A. McGahanNew YorkJ. Wileyc1999XIV, 228 p.ill.24 cm.001SUN00253402001 ˆA ‰Wiley Interscience publication210 New YorkWiley.USNew YorkSUNL000011Tompkins, Harland G.SUNV034516727342McGahan, William A.SUNV034517727341WileySUNV000201650ITSOL20201005RICASUN0041754UFFICIO DI BIBLIOTECA DEL DIPARTIMENTO DI INGEGNERIA05CONS M I 056 05 2996 20060308 Spectroscopic ellipsometry and reflectometry1421801UNICAMPANIA00552nas 2200205z- 450 9962055335033162047-4334(CKB)2670000000127961(DE-599)ZDB2038492-0(EXLCZ)99267000000012796120191120cuuuuuuuu -u- -engCountry Report: Netherlands AntillesEIULondonCountry report. Netherlands AntillesCountry ReportJOURNAL996205533503316Country Report1321002UNISA