01619nam 2200445 450 99620493510331620230421041059.0(CKB)111026746743038(SSID)ssj0000558907(PQKBManifestationID)12197551(PQKBTitleCode)TC0000558907(PQKBWorkID)10565291(PQKB)11399688(WaSeSS)IndRDA00124075(EXLCZ)9911102674674303820200602d1996 uy 0engur|||||||||||txtccrATS '96 proceedings of the Fifth Asian Test Symposium : November 20-22, 1996, Hsinchu, Taiwan /sponsored by the IEEE Computer Society Technical Committee on Test Technology -- Asia Subcommittee, National Tsing Hua UniversityLos Alamitos, California :IEEE Computer Society,1996.1 online resource (154 pages)Bibliographic Level Mode of Issuance: Monograph0-8186-7478-4 Electronic digital computersCircuitsTestingCongressesElectronic circuitsTestingCongressesFault-tolerant computingCongressesElectronic digital computersCircuitsTestingElectronic circuitsTestingFault-tolerant computing62IEEE Computer Society.Test Technology Technical Committee.Asia Subcommittee,WaSeSSWaSeSSBOOK996204935103316ATS '962338175UNISA