03077nam 2200649 450 99620476830331620221206093741.01-282-33149-397866123314970-470-45526-80-470-45525-X10.1002/9780470455265(CKB)1000000000807695(EBL)739045(SSID)ssj0000342280(PQKBManifestationID)11259726(PQKBTitleCode)TC0000342280(PQKBWorkID)10285505(PQKB)11296433(MiAaPQ)EBC739045(CaBNVSL)mat05361029(IDAMS)0b00006481178849(IEEE)5361029(PPN)257509054(OCoLC)463436649(EXLCZ)99100000000080769520110519h20152009 uy 0engur|n|---|||||txtccrReliability wearout mechanisms in advanced CMOS technologies /Alvin W. Strong ... [et al.]Piscataway, New Jersey :IEEE Press,c2009.1 online resource (642 p.)IEEE Press series on microelectronic systems ;12Description based upon print version of record.0-471-73172-2 Includes bibliographical references and index.Introduction / Alvin W. Strong -- Dielectric characterization and reliability methodology / Ernest Y. Wu, Rolf-Peter Vollertsen, and Jordi Suñé -- Dielectric breakdown of gate oxides: physics and experiments / Ernest Y. Wu, Rolf-Peter Vollertsen, and Jordi Suñé -- Negative bias temperature instabilities in pMOSFET devices / Giuseppe LaRosa -- Hot carriers / Stewart E. Rauch, III -- Stress-induced voiding / Timothy D. Sullivan -- Electromigration / Timothy D. Sullivan.A comprehensive treatment of all aspects of CMOS reliability wearout mechanisms This book covers everything students and professionals need to know about CMOS reliability wearout mechanisms, from basic concepts to the tools necessary to conduct reliability tests and analyze the results. It is the first book of its kind to bring together the pertinent physics, equations, and procedures for CMOS technology reliability in one place. Divided into six relatively independent topics, the book covers: Introduction to Reliability Gate Dielectric Reliability Negative Bias IEEE Press Series on Microelectronic Systems ;12Metal oxide semiconductors, ComplementaryReliabilityMicroelectronicsMetal oxide semiconductors, ComplementaryReliability.Microelectronics.621.39732ELT 358fstubZN 4960rvkStrong Alvin Wayne1946-845570CaBNVSLCaBNVSLCaBNVSLBOOK996204768303316Reliability wearout mechanisms in advanced CMOS technologies1887744UNISA