03274oam 2200517zu 450 99620451560331620210807003337.0(CKB)111026746745370(SSID)ssj0000558514(PQKBManifestationID)12198046(PQKBTitleCode)TC0000558514(PQKBWorkID)10565554(PQKB)11690510(EXLCZ)9911102674674537020160829d1997 uy engtxtccrMemory Technology, Design and Testing, 1997: IEEE International Workshop on (MTDT '97)[Place of publication not identified]IEEE Computer Society Press1997Bibliographic Level Mode of Issuance: Monograph0-8186-8099-7 Matching memory to the power of personal computers / R. Foss -- A low-cost, high performance three-dimensional memory module technology / A. Glaser ... [et al.] -- High speed circuit techniques in a 150MHz 64M SDRAM / V. Lines ... [et al.] -- An analysis of (linked) addressed decoder faults / A. van de Goor, G. Gaydadjiev -- SRAM yield estimation in the early stage of the design cycle / V. Kim, T. Chen -- False write through and un-restored write electrical level fault models for SRAMs / R. Adams, E. Cooley -- A defect-tolerant DRAM employing a hierarchical redundancy scheme, built-in self-test and self-reconfiguration / D. Niggemeyer, J. Otterstedt, M. Redeker -- Formal verification of memory arrays using symbolic trajectory evaluation / M. Pandey, R. Bryant -- A product development flow with metrics for memory designs / S. Hegde, I. Pal, K. Rao -- A low-power high storage capacity structure for GaAs MESFET ROM / R. Kanan ... [et al.] -- Use of selective precharge for low-power on the match lines of content-addressable memories / C. Zukowski, S. Wang -- An open notation for memory tests / A. Offerman, A. van de Goor -- Testing memory modules in SRAM-based configurable FPGAs / W. Huang ... [et al.] -- Memory array testing through a scannable configuration / S. Yano, N. Ishiura -- A high-speed parallel sensing scheme for multi-level non-volatile memories / C. Calligaro ... [et al.].Semiconductor storage devicesCongressesTestingRandom access memoryCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCSemiconductor storage devicesCongressesTestingRandom access memoryCongressesElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.39/732Rajsuman RochitLombardi FabrizioWik TIEEE Computer Society Technical Committee on VLSI,IEEE Computer Society Test Technology Technical CommitteeIEEE International Workshop on Memory Technology, Design, and TestingPQKBBOOK996204515603316Memory Technology, Design and Testing, 1997: IEEE International Workshop on (MTDT '97)2301862UNISA