01727oam 2200493zu 450 99620450020331620210806235947.0(CKB)1000000000022450(SSID)ssj0000395615(PQKBManifestationID)12144176(PQKBTitleCode)TC0000395615(PQKBWorkID)10456783(PQKB)10339824(EXLCZ)99100000000002245020160829d2004 uy engtxtccr2004 1st IEEE Lightwave Technologies in Instrumentation and Measurement Conference : Palisades, NY, 19-20 October, 2004[Place of publication not identified]IEEE2004Bibliographic Level Mode of Issuance: Monograph0-7803-8723-6 0-7803-8722-8 ElectroopticsCongressesElectrooptical devicesCongressesPhotometryCongressesOptical measurementsCongressesEngineering & Applied SciencesHILCCApplied PhysicsHILCCElectroopticsElectrooptical devicesPhotometryOptical measurementsEngineering & Applied SciencesApplied Physics621.381/045IEEE Metropolitan Sections Activities CouncilIEEE Lightwave Technologies in Instrumentation and Measurement ConferencePQKBPROCEEDING9962045002033162004 1st IEEE Lightwave Technologies in Instrumentation and Measurement Conference : Palisades, NY, 19-20 October, 20042539082UNISA