01832oam 2200469zu 450 99620446960331620210807003349.0(CKB)111026746712728(SSID)ssj0000455345(PQKBManifestationID)12148334(PQKBTitleCode)TC0000455345(PQKBWorkID)10399475(PQKB)11015469(EXLCZ)9911102674671272820160829d1996 uy engtxtccr1995 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 22-25, 1995[Place of publication not identified]IEEE Electron Devices Society1996Bibliographic Level Mode of Issuance: Monograph0-7803-2705-5 Integrated circuitsCongressesReliabilityIntegrated circuitsReliabilityWafer scale integrationCongressesElectrical & Computer EngineeringHILCCElectrical EngineeringHILCCEngineering & Applied SciencesHILCCIntegrated circuitsCongressesReliabilityIntegrated circuitsReliabilityWafer scale integrationCongressesElectrical & Computer EngineeringElectrical EngineeringEngineering & Applied Sciences621.3815IEEE Electron Devices SocietyIEEE Reliability SocietyInternational Integrated Reliability WorkshopPQKBBOOK9962044696033161995 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 22-25, 19952531430UNISA