01764oam 2200493zu 450 99620445450331620210807003354.0(CKB)111026746713852(SSID)ssj0000455363(PQKBManifestationID)12185182(PQKBTitleCode)TC0000455363(PQKBWorkID)10399685(PQKB)10907155(EXLCZ)9911102674671385220160829d1995 uy engtxtccrProceedings[Place of publication not identified]The Conference1995Bibliographic Level Mode of Issuance: Monograph0-7803-2992-9 Integrated circuitsTestingCongressesElectronic digital computersTestingCongressesCircuitsTelecommunicationCongressesTestingEquipment and suppliesElectrical & Computer EngineeringHILCCElectrical EngineeringHILCCEngineering & Applied SciencesHILCCIntegrated circuitsTestingCongressesElectronic digital computersTestingCongressesCircuitsTelecommunicationCongressesTestingEquipment and suppliesElectrical & Computer EngineeringElectrical EngineeringEngineering & Applied Sciences621.3815IEEE Computer Society Test Technology Technical CommitteeInstitute of Electrical and Electronics Engineers Philadelphia Section.International Test ConferencePQKBBOOK996204454503316Proceedings57126UNISA