01570oam 2200397zu 450 99620407210331620210806235801.01-5090-9773-2(CKB)1000000000022576(SSID)ssj0000395392(PQKBManifestationID)12081925(PQKBTitleCode)TC0000395392(PQKBWorkID)10450558(PQKB)11136093(EXLCZ)99100000000002257620160829d2005 uy engtxtccr2005 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 2005[Place of publication not identified]IEEE Electron Devices Society2005Bibliographic Level Mode of Issuance: Monograph0-7803-8992-1 Integrated circuitsReliabilityCongressesIntegrated circuitsReliabilityWafer-scale integrationCongressesIntegrated circuitsReliabilityIntegrated circuitsReliabilityWafer-scale integrationIEEE Reliability SocietyIEEE Electron Devices SocietyInternational Integrated Reliability WorkshopPQKBPROCEEDING9962040721033162005 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 20052539079UNISA00967nam0 2200265 450 00003694920250129101102.088-85982-03-420250129d1992----km-y0itay50------baitaITy-------001yyStoria della consulenza di direzione in Italiaprotagonisti, idee, tendenze evolutiveGiuliano Faliva, Ferdinando PennarolaMilanoEdizioni Olivares1992343 p.22 cm2001Storia della consulenza di direzione in Italia493151658.460922Direzione d'azienda. Uso dei consulenti. Storia e geografiaFaliva,Giuliano379253Pennarola,Ferdinando116337ITUNIPARTHENOPE20250129REICATUNIMARC000036949DISAE 511/1173805 ex St.Az.NAVA22025Storia della consulenza di direzione in Italia493151UNIPARTHENOPE